Title :
Part 7: analog-to-digital conversion in real-time systems
Author_Institution :
Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA
Abstract :
This article, as part of a series on real-time systems, covers analog-to-digital converters (ADC). It begins with some basic definitions for converters, then covers some nonideal behaviors of ADCs and how to test them. Finally, it concludes with a brief description of the architecture of ADCs and how they might be used.
Keywords :
analogue-digital conversion; circuit testing; network synthesis; real-time systems; ADC architecture; ADC testing; analog-to-digital converters; nonideal ADC behavior; real-time systems; Analog-digital conversion; Apertures; Binary codes; Circuit noise; Instruments; Quantization; Real time systems; Signal to noise ratio; Testing; Transfer functions;
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
DOI :
10.1109/MIM.2003.1238355
