DocumentCode :
808653
Title :
A full code-patterns coverage high-speed embedded ROM using dynamic virtual guardian technique
Author :
Chang, Meng-Fan ; Chiou, Lih-Yih ; Wen, Kuei-Ann
Author_Institution :
Inst. of Electron., Nat. Chiao Tung Univ., Hsin-Chu, Taiwan
Volume :
41
Issue :
2
fYear :
2006
Firstpage :
496
Lastpage :
506
Abstract :
Crosstalk between bitlines induces read failure and limits the coverage of applicable code-patterns for high-speed contact/via-programming read-only memories (ROMs) in SoC. Owing to the variation in bitline loading across code-patterns, the amount of coupled noise on an accessed bitline is code-pattern-dependent. This crosstalk effect worsens, with larger coupling capacitance and smaller intrinsic loading, as the technology node shrinks. This study proposes dynamic virtual guardian (DVG) techniques for contact/via-programming ROM macros and compilers to eliminate the crosstalk-induced read failure and increase the code-patterns coverage. Compared with conventional ROMs, DVG techniques achieve higher speed, lower power consumption and better design for manufacturing (DFM) capability with full code-patterns coverage. Experiments on fabricated designs, a conventional ROM and two 256 Kb DVG ROMs, using 0.18 μm 1P5M CMOS technology have demonstrated that DVG techniques achieve 100% code-pattern coverage under a small sensing margin.
Keywords :
CMOS integrated circuits; crosstalk; design for manufacture; embedded systems; interference suppression; read-only storage; 0.18 micron; 256 kbit; CMOS technology; code-pattern-dependent; compilers; contact ROM; coupling capacitance; crosstalk effect; design for manufacturing; dynamic virtual guardian technique; full code-patterns; high-speed embedded ROM; read-only memories; system-on-chip; via-programming ROM; CMOS technology; Capacitance; Circuits; Contacts; Crosstalk; Energy consumption; Intellectual property; Manufacturing; Random access memory; Read only memory; Code-patterns; ROM; crosstalk;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2005.862343
Filename :
1583813
Link To Document :
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