Title :
Correlation between the low-frequency noise spectral density and the static device parameters of silicon-on-insulator MOSFETs
Author :
Simoen, E. ; Claeys, C.
Author_Institution :
IMEC, Leuven, Belgium
fDate :
8/1/1995 12:00:00 AM
Abstract :
The empirical relationship between the device transconductance and the input-referred noise spectral density observed on partially depleted SOI n-MOSFETs is examined for other types of devices. As is shown, buried-channel p-MOSFETs processed in the same 1 μm CMOS SOI technology show the same behavior. The exponential dependence is also observed for SDI n-MOSFETs fabricated in a 3 μm CMOS technology, strongly emphasizing the generality of the result. Furthermore, it is valid both in linear operation (weak and strong inversion) and in saturation. The physical back-ground of this correlation is further elaborated and a new relationship is derived for the noise in the subthreshold regime.
Keywords :
MOSFET; semiconductor device noise; silicon-on-insulator; 1 micron; 3 micron; CMOS technology; SDI n-MOSFET; buried-channel p-MOSFET; device transconductance; input-referred noise spectral density; linear operation; low-frequency noise spectral density; partially depleted SOI devices; silicon-on-insulator MOSFET; static device parameters; subthreshold regime; CMOS process; CMOS technology; Fluctuations; Frequency; Low-frequency noise; MOSFET circuits; Silicon on insulator technology; Threshold voltage; Transconductance; Ultra large scale integration;
Journal_Title :
Electron Devices, IEEE Transactions on