• DocumentCode
    808886
  • Title

    Proton-sensitive custom SRAM detector

  • Author

    Soli, G.A. ; Blaes, B.R. ; Buehler, M.G.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    39
  • Issue
    5
  • fYear
    1992
  • fDate
    10/1/1992 12:00:00 AM
  • Firstpage
    1374
  • Lastpage
    1378
  • Abstract
    A custom 4k-bit static RAM (SRAM) chip was tested with protons. The SRAM was developed to determine the single event upset hardness of hardness of CMOS latches using alpha particle measurements and can also function as a proton detector. The authors describe a calibration procedure for the SRAM detector, allowing spectrometers to be designed for measuring proton, helium, and heavier ion environments inside spacecraft computers. The detector was calibrated for protons using the Caltech Tandem Van de Graaff. The SPICE circuit simulation program was used to compute an effective calibration curve and this curve was then used, with the proton data, to compute an effective charge collection depth, allowing calibration
  • Keywords
    CMOS integrated circuits; SPICE; SRAM chips; aerospace instrumentation; alpha-particle detection and measurement; calibration; proton detection and measurement; radiation hardening (electronics); semiconductor counters; CMOS latches; SPICE circuit simulation program; alpha particle measurements; calibration procedure; charge collection depth; custom SRAM detector; single event upset hardness; spectrometers; static RAM; Alpha particles; Calibration; Detectors; Latches; Protons; Random access memory; Read-write memory; Semiconductor device measurement; Single event upset; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.173209
  • Filename
    173209