Title :
A comprehensive explanation of distortion sideband asymmetries
Author :
De Carvalho, Nuno Borges ; Pedro, José Carlos
Author_Institution :
Instituto de Telecomunicacoes, Aveiro Univ., Portugal
fDate :
9/1/2002 12:00:00 AM
Abstract :
This paper presents a comprehensive study of intermodulation-distortion response asymmetries often observed in microwave nonlinear systems subject to a two-tone or multitone test. The reasons for the different amplitudes of the two adjacent tones are first investigated under small- and large-signal regimes, using a general circuit with frequency-dependent embedding impedances and resistive and reactive nonlinearities. It is shown that this intriguing phenomenon can be mainly attributed to the terminating impedances at the baseband or difference frequencies. Multitone behavior is also addressed and its main differences from the two-tone case explained. Those theoretical conclusions are then extrapolated for real circuits and validated by measured results obtained from microwave power amplifiers of two different technologies, i.e., a GaAs MESFET and an Si bipolar junction transistor
Keywords :
intermodulation distortion; microwave measurement; microwave power amplifiers; nonlinear systems; semiconductor device testing; MESFET; bipolar junction transistor; distortion sideband asymmetries; frequency-dependent embedding impedances; intermodulation-distortion response asymmetries; large-signal regimes; microwave nonlinear systems; microwave power amplifiers; multitone test; reactive nonlinearities; resistive nonlinearities; small-signal regimes; terminating impedances; two-tone test; Baseband; Circuit testing; Frequency; Impedance; Microwave circuits; Microwave measurements; Nonlinear distortion; Nonlinear systems; Power measurement; System testing;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2002.802321