DocumentCode
809039
Title
Frequency domain implementation of the three-dimensional geometric point response correction in SPECT imaging
Author
Zeng, G.L. ; Gullberg, G.T.
Author_Institution
Dept. of Radiol., Utah Univ., Salt Lake City, UT, USA
Volume
39
Issue
5
fYear
1992
fDate
10/1/1992 12:00:00 AM
Firstpage
1444
Lastpage
1453
Abstract
Analytical expressions exist for the geometric point response functions for parallel, fan, and cone beam collimators. The geometric point response functions are shown to be shift-invariant for these three collimators if the distance between the point source and the detection plane is constant. For single photon emission computed tomography (SPECT), this property is used in the projector/backprojector to correct for geometric distortion using the iterative EM reconstruction algorithm. In the implementation, the system geometric response, the crystal intrinsic response and the attenuation were compensated. The attenuation compensation was accomplished in the spatial domain. The point response corrections were accomplished using frequency domain filtering, taking advantage of the shift-invariance of the system point response function at a fixed depth. The frequency domain implementation significantly speeded up the algorithm. Phantom studies showed the increase of resolution and the reduction of density nonuniformity artifacts which were due to the spatially varying system response function and the attenuation effect
Keywords
computerised tomography; radioisotope scanning and imaging; attenuation compensation; attenuation effect; cone beam collimators; crystal intrinsic response; diagnostic nuclear medicine; geometric distortion; geometric point response functions; single photon emission computed tomography; Apertures; Attenuation; Detectors; Face detection; Frequency domain analysis; Geometry; Image reconstruction; Optical collimators; Reconstruction algorithms; Single photon emission computed tomography;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.173222
Filename
173222
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