Title :
Statistical characterization of sample fourth-order cumulants of a noisy complex sinusoidal process
Author :
Tichavský, Petr ; Swami, Ananthram
Author_Institution :
Inst. of Inf. Theory & Autom., Acad. of Sci., Prague, Czech Republic
fDate :
7/1/1995 12:00:00 AM
Abstract :
The paper deals with the statistical characterization of sample estimates of the fourth-order cumulants of a random process consisting of multiple complex sinusoids and additive colored Gaussian noise. In particular, it presents necessary and sufficient conditions for strong consistency of the sample cumulants of arbitrary orders, and derives expressions for the asymptotic covariance of the sample estimates of the fourth-order cumulants. It is shown that the fourth-order cumulant C4y (τ1,...,τ4) can be written as a function of a single argument τ=τ3+τ4 -τ1-τ2, which implies large flexibility in estimating the cumulant. It is recommended that the estimate be based upon lags such that τ1 is distant from τ2 and τ3 is distant from τ4, and/or as a linear combination of such terms. The asymptotic variance of a cumulant-based frequency estimator is shown to have the form c2·SNR-2+c3·SNR-3 +c4·SNR-4, where the coefficient c 2 may possibly vanish. The theory is illustrated via numerical examples. The results of this paper will be useful in analyzing the performance of various cumulant-based frequency estimation algorithms
Keywords :
Gaussian noise; frequency estimation; higher order statistics; random processes; signal sampling; additive colored Gaussian noise; asymptotic covariance; asymptotic variance; frequency estimation algorithms; frequency estimator; necessary conditions; noisy complex sinusoidal process; random process; sample estimates; sample fourth-order cumulants; statistical characterization; sufficient conditions; Additive noise; Algorithm design and analysis; Colored noise; Frequency estimation; Gaussian noise; Performance analysis; Random processes; Signal processing algorithms; Sufficient conditions; Yield estimation;
Journal_Title :
Signal Processing, IEEE Transactions on