DocumentCode :
809701
Title :
Comparison of SOI and junction isolation for substrate crosstalk suppression in mixed mode integrated circuits
Author :
Joardar, K.
Author_Institution :
Semicond. Products Sector, Motorola Inc., Mesa, AZ, USA
Volume :
31
Issue :
15
fYear :
1995
fDate :
7/20/1995 12:00:00 AM
Firstpage :
1230
Lastpage :
1231
Abstract :
Using two-dimensional computer simulations and measurements on silicon, it is shown that whereas silicon-on-insulator (SOI) based processes provide high isolation from crosstalk in mixed mode analogue-digital integrated circuits, p-i-n junction isolation can provide equal or better crosstalk immunity with less expense
Keywords :
crosstalk; digital simulation; integrated circuit modelling; isolation technology; mixed analogue-digital integrated circuits; p-n junctions; silicon-on-insulator; SOI; crosstalk immunity; junction isolation; mixed analogue-digital integrated circuits; mixed mode integrated circuits; p-i-n junction isolation; substrate crosstalk suppression; two-dimensional computer simulations;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19950861
Filename :
400332
Link To Document :
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