Title : 
Comparison of SOI and junction isolation for substrate crosstalk suppression in mixed mode integrated circuits
         
        
        
            Author_Institution : 
Semicond. Products Sector, Motorola Inc., Mesa, AZ, USA
         
        
        
        
        
            fDate : 
7/20/1995 12:00:00 AM
         
        
        
        
            Abstract : 
Using two-dimensional computer simulations and measurements on silicon, it is shown that whereas silicon-on-insulator (SOI) based processes provide high isolation from crosstalk in mixed mode analogue-digital integrated circuits, p-i-n junction isolation can provide equal or better crosstalk immunity with less expense
         
        
            Keywords : 
crosstalk; digital simulation; integrated circuit modelling; isolation technology; mixed analogue-digital integrated circuits; p-n junctions; silicon-on-insulator; SOI; crosstalk immunity; junction isolation; mixed analogue-digital integrated circuits; mixed mode integrated circuits; p-i-n junction isolation; substrate crosstalk suppression; two-dimensional computer simulations;
         
        
        
            Journal_Title : 
Electronics Letters
         
        
        
        
        
            DOI : 
10.1049/el:19950861