Title :
A Case Study of Signal-to-Noise Ratio in Ring-Based Optical Networks-on-Chip
Author :
Duong, Luan H. K. ; Nikdast, Mahdi ; Le Beux, Sebastien ; Jiang Xu ; Xiaowen Wu ; Zhehui Wang ; Peng Yang
Author_Institution :
Hong Kong Univ. of Sci. & Technol., Hong Kong, China
Abstract :
Microresonators have been utilized to construct optical interconnection networks. One of the drawbacks of these microresonators is that they suffer from intrinsic crosstalk noise and power loss, resulting in Signal-to-Noise Ratio (SNR) reduction and system performance degradation at the network level. The novel contribution of this paper is to systematically study the worst-case crosstalk noise and SNR in a ring-based ONoC, the Corona. In the paper, Corona´s data channel and broadcast bus are investigated, with formal general analytical models presented at the device and network levels. Leveraging our detailed analytical models, we present quantitative simulations of the worst-case power loss, crosstalk noise, and SNR in Corona. Moreover, we compare the worst-case results in Corona with those in mesh-based and folded-torus-based ONoCs, all of which consist of the same number of cores as Corona. The quantitative results demonstrate the damaging impact of crosstalk noise and power loss in Corona: the worst-case SNR is roughly 14.0 dB in the network, while the worst-case power loss is substantially high at -69.3 dB in the data channel.
Keywords :
corona; integrated circuit noise; integrated optoelectronics; network-on-chip; optical crosstalk; optical interconnections; optical noise; SNR reduction; broadcast bus; corona data channel; folded-torus-based ONoCs; general analytical models; intrinsic crosstalk noise; mesh-based ONoCs; microresonators; network level; optical interconnection networks; power loss; quantitative simulations; ring-based ONoC; ring-based optical networks-on-chip; signal-to-noise ratio; system performance degradation; worst-case power loss; Crosstalk; Detectors; Multicore processing; Nanophotonics; Optical crosstalk; Optical modulation; Optical waveguides; Signal to noise ratio; Silicon;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2014.2336211