• DocumentCode
    810318
  • Title

    Investigation of millimeter-wave scattering from frequency selective surfaces

  • Author

    Schimert, Thomas R. ; Brouns, Austin J. ; Chan, Chi H. ; Mittra, Raj

  • Author_Institution
    LTV Missiles & Electron. Group, Dallas, TX, USA
  • Volume
    39
  • Issue
    2
  • fYear
    1991
  • fDate
    2/1/1991 12:00:00 AM
  • Firstpage
    315
  • Lastpage
    322
  • Abstract
    A comparative numerical and experimental analysis of scattering from dielectric-backed frequency-selective surfaces in W-band (75-110 GHz) was carried out. The examples studied include metal (aluminium), resistive (bismuth), and bismuth-loaded I-pole or linearized Jerusalem cross arrays on fused silica, all of which exhibit a band-stop resonance in W-band as a general feature. The arrays were fabricated using standard photolithographic techniques. The numerical analysis involves the solution of an electric field integral equation using subdomain rooftop basis and testing functions within the framework of the Galerkin testing procedure. The lossy nature of the materials was fully accounted for. A comparative analysis of doubly stacked aluminium I-pole arrays was also performed. The numerical analysis exploits a variant of the cascade method in that the immediately adjacent dielectric layers are included in the construction of the scattering matrix for the frequency selective surface. This allows the higher-order evanescent Floquet modes to decay sufficiently at the dielectric boundaries so they can be ignored in the scattering matrix
  • Keywords
    S-matrix theory; electromagnetic wave scattering; integral equations; 75 to 110 GHz; Al I-pole arrays; Al-SiO2; Bi loaded I-pole array; Bi-SiO2; EHF; EM waves; Galerkin testing procedure; MM-waves; W-band; band-stop resonance; cascade method; dielectric mounted FSS; doubly stacked arrays; electric field integral equation; frequency selective surfaces; fused silica; higher-order evanescent Floquet modes; linearized Jerusalem cross arrays; lossy nature; metal type; millimeter-wave scattering; numerical analysis; resistive type; scattering matrix; standard photolithographic techniques; subdomain rooftop basis; testing functions; Aluminum; Bismuth; Dielectrics; Frequency; Millimeter wave technology; Numerical analysis; Resonance; Scattering; Silicon compounds; Testing;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.102976
  • Filename
    102976