• DocumentCode
    810474
  • Title

    Using neural networks in reliability prediction

  • Author

    Karunanithi, Nachimuthu ; Whitley, Darrell ; Malaiya, Yashwant K.

  • Author_Institution
    CS Dept., Colorado State Univ., Fort Collins, CO, USA
  • Volume
    9
  • Issue
    4
  • fYear
    1992
  • fDate
    7/1/1992 12:00:00 AM
  • Firstpage
    53
  • Lastpage
    59
  • Abstract
    It is shown that neural network reliability growth models have a significant advantage over analytic models in that they require only failure history as input and not assumptions about either the development environment or external parameters. Using the failure history, the neural-network model automatically develops its own internal model of the failure process and predicts future failures. Because it adjusts model complexity to match the complexity of the failure history, it can be more accurate than some commonly used analytic models. Results with actual testing and debugging data which suggest that neural-network models are better at endpoint predictions than analytic models are presented.<>
  • Keywords
    computational complexity; neural nets; software reliability; debugging data; failure history; model complexity; neural networks; reliability prediction; Biological neural networks; Biological systems; Failure analysis; History; Intelligent networks; Neural networks; Predictive models; Probability; Software systems; Testing;
  • fLanguage
    English
  • Journal_Title
    Software, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7459
  • Type

    jour

  • DOI
    10.1109/52.143107
  • Filename
    143107