Title :
Low-loss on-chip transmission lines with micro-patterned artificial dielectric shields
Author :
Ma, Y. ; Rejaei, B. ; Zhuang, Y.
Author_Institution :
Delft Inst. of Microsyst. & Nanoelectron. (DIMES), Tech. Univ. Delft, Delft
Abstract :
Low-loss coplanar waveguide (CPW) transmission lines integrated on a standard (5 -10 Omega ldr cm) silicon substrate are realised by using an artificial dielectric shield with a very high in-plane dielectric constant. The shield consists of a 30 nm-thick Al2O3 film sandwiched by two 100 nm-thick aluminium layers patterned into lattices of mum-size elements. The individual metallic elements are micro-patterned to suppress the flow of eddy currents at microwave frequencies. Inserted below the CPW, the shield blocks the electric field of the line from entering the silicon substrate. The resulting line attenuation (measured up to 25 GHz) is comparable to that of identical CPWs built on a high-resistivity silicon wafer.
Keywords :
coplanar transmission lines; coplanar waveguides; eddy currents; electric fields; microwave integrated circuits; system-on-chip; Al2O3; Si; coplanar waveguide; eddy currents; electric field; high-resistivity silicon wafer; low-loss on-chip transmission lines; micropatterned artificial dielectric shield; microwave frequency; size 100 nm; size 30 nm;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20081324