• DocumentCode
    810744
  • Title

    Statistical analysis of effective singular values in matrix rank determination

  • Author

    Konstantinides, Konstantinos ; Yao, Kung

  • Author_Institution
    Hewlett-Packard Labs., Palo Alto, CA, USA
  • Volume
    36
  • Issue
    5
  • fYear
    1988
  • fDate
    5/1/1988 12:00:00 AM
  • Firstpage
    757
  • Lastpage
    763
  • Abstract
    A major problem in using SVD (singular-value decomposition) as a tool in determining the effective rank of a perturbed matrix is that of distinguishing between significantly small and significantly large singular values to the end, conference regions are derived for the perturbed singular values of matrices with noisy observation data. The analysis is based on the theories of perturbations of singular values and statistical significance test. Threshold bounds for perturbation due to finite-precision and i.i.d. random models are evaluated. In random models, the threshold bounds depend on the dimension of the matrix, the noisy variance, and predefined statistical level of significance. Results applied to the problem of determining the effective order of a linear autoregressive system from the approximate rank of a sample autocorrelation matrix are considered. Various numerical examples illustrating the usefulness of these bounds and comparisons to other previously known approaches are given
  • Keywords
    information theory; matrix algebra; statistical analysis; SVD; conference regions; effective singular values; finite precision models; i.i.d. random models; linear autoregressive system; matrix rank determination; noisy observation data; noisy variance; perturbed matrix; sample autocorrelation matrix; singular-value decomposition; statistical analysis; statistical significance level; Autocorrelation; Data analysis; Least squares approximation; Matrices; Matrix decomposition; NASA; Noise level; Roundoff errors; Statistical analysis; Testing;
  • fLanguage
    English
  • Journal_Title
    Acoustics, Speech and Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-3518
  • Type

    jour

  • DOI
    10.1109/29.1585
  • Filename
    1585