Title : 
Hybrid field-dependent mobility model for the simulation of power VDMOSTs
         
        
            Author : 
Zeng, J. ; Mawby, P.A. ; Towers, M.S. ; Board, K.
         
        
            Author_Institution : 
Dept. of Electr. & Electron. Eng., Univ. of Wales, Swansea, UK
         
        
        
        
        
            fDate : 
1/18/1996 12:00:00 AM
         
        
        
        
            Abstract : 
An experimentally verified hybrid model of field-dependent mobility is proposed for the 2-D numerical simulation of power VDMOSTs. With the new scheme, the 2-D simulation of the DC output characteristics agrees very well with the experimental results with a single value of the surface degradation factor
         
        
            Keywords : 
carrier mobility; power MOSFET; semiconductor device models; 2D numerical simulation; DC output characteristics; field-dependent mobility; hybrid model; power VDMOSTs; surface degradation factor;
         
        
        
            Journal_Title : 
Electronics Letters
         
        
        
        
        
            DOI : 
10.1049/el:19960067