• DocumentCode
    810846
  • Title

    Effect of etch holes on quality factor of bulk-mode micromechanical resonators

  • Author

    Shao, L. ; Palaniapan, M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore
  • Volume
    44
  • Issue
    15
  • fYear
    2008
  • Firstpage
    938
  • Lastpage
    939
  • Abstract
    A report is presented, for the first time, on the effect of release etch holes on the quality factors of bulk-mode micromechanical resonators. The bulk resonators were operated in the Lame mode with frequencies around 6 MHz. Periodic 10 mum square etch holes with 30 mum spacing were placed at various locations on the surface of the resonator. A study on five such identical resonators with etch holes at various locations conclusively shows that etch holes decrease the quality factors by more than an order of magnitude from 1.67 million to 116 000 owing to two main energy loss mechanisms. Furthermore, it is demonstrated that the quality factor depends on the location of etch holes on the resonator.
  • Keywords
    etching; micromechanical resonators; Lame mode; bulk-mode micromechanical resonators; energy loss mechanisms; etch holes; quality factor; size 10 mum;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20081320
  • Filename
    4568725