DocumentCode :
810891
Title :
A Hands-On Freshman Survey Course to Steer Undergraduates Into Microsystems Coursework and Research
Author :
Eddings, Mark A. ; Stephenson, James C. ; Harvey, Ian R.
Author_Institution :
Dept. of Bioeng., Univ. of Utah, Salt Lake City, UT, USA
Volume :
52
Issue :
3
fYear :
2009
Firstpage :
312
Lastpage :
317
Abstract :
Full class loads and inflexible schedules can be a significant obstacle in the implementation of freshman survey courses designed to guide engineering students into emerging research areas such as micro- and nanosystems. A hands-on, interactive course was developed to excite freshmen early in their engineering program to pursue research and careers in microsystems. The course focused on the top-down and bottom-up approaches to building devices, including the metrology tools required for visualization and characterization at the micro- and nanoscales. Modular lab components required students to interact with, build, and characterize microsystems. Macroscale versions were used to teach microscale concepts. An introductory module included dissecting the iPod Mp3 player, understanding its macroscale components and inspecting the microscale components in optical and scanning electron microscopes (SEM). A summary of the class focus and lab exercise modules is reported.
Keywords :
educational courses; engineering education; micromechanical devices; scanning electron microscopes; engineering students; hands-on freshman survey course; iPod Mp3 player; macroscale components; microscale concepts; microsystems; modular lab components; nanosystems; optical microscopes; scanning electron microscopes; Buildings; Electron optics; Engineering profession; Engineering students; Metrology; Nanoscale devices; Optical microscopy; Portable media players; Scanning electron microscopy; Visualization; Freshmen introductory engineering; interactive; microsystems and nanosystems; survey course; workforce training pipeline;
fLanguage :
English
Journal_Title :
Education, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9359
Type :
jour
DOI :
10.1109/TE.2008.928216
Filename :
4908908
Link To Document :
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