DocumentCode :
810996
Title :
High-performance GaAs heterojunction bipolar transistor monolithic logarithmic IF amplifiers
Author :
Oki, A.K. ; Kim, M.E. ; Gorman, G.M. ; Camou, J.B.
Author_Institution :
TRW Inc., Redondo Beach, CA, USA
Volume :
36
Issue :
12
fYear :
1988
Firstpage :
1958
Lastpage :
1965
Abstract :
Logarithmic IF amplifiers that implement both true and successive-detection designs are reported. Monolithically cascaded log gain stages are used to achieve piecewise-approximated logarithmic functions for the compression of signals over a wide dynamic range. The heterojunction bipolar transistor (HBT) IC fabrication process is based on a 3- mu m-emitter, self-aligned-base ohmic metal transistor using both molecular-beam epitaxy (MBE) and metal-organic metal vapor deposition (MOCVD) growth structures. The true log amp integrates four dual-gain (limiting and unity gain) stages without on-chip video detection. Its performance includes DC-3-GHz IF/video bandwidth, 400-ps rise time, <+or-dB log error over approximately=40-dB dynamic range at 3 GHz, and a tangential signal sensitivity (noise) of -60 dBm (test-set limited). The successive-detection log amp, designed for lower frequency and dynamic range applications, uses three limiting gain stages and four detector stages to achieve a 550-MHz bandwidth and <-0.34-dB log error over a 27-dB dynamic range. It is able to process 13-ns pulses with 5.0-ns and 5.2-ns risetimes and fall times, respectively.<>
Keywords :
III-V semiconductors; MMIC; bipolar integrated circuits; gallium arsenide; heterojunction bipolar transistors; intermediate-frequency amplifiers; microwave amplifiers; video amplifiers; wideband amplifiers; 0 to 3 GHz; 3 GHz; 3 micron; 400 ps; 5 to 13 ns; 550 MHz; GaAs; HBT; IC fabrication process; III-V-semiconductors; MBE; MMIC; MOCVD; cascaded log gain stages; dual-gain stages; heterojunction bipolar transistor; limiting gain stages; logarithmic IF amplifiers; metal-organic metal vapor deposition; molecular-beam epitaxy; monolithic IC; ohmic metal transistor; piecewise-approximated logarithmic functions; rise time; self-aligned-base; successive-detection designs; true log amp; video bandwidth; Bandwidth; Bipolar integrated circuits; Chemical vapor deposition; Dynamic range; Fabrication; Gallium arsenide; Heterojunction bipolar transistors; MOCVD; Molecular beam epitaxial growth; Testing;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.17440
Filename :
17440
Link To Document :
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