Optimized method for obtaining permittivity and conductivity profiles of microwave materials

Author

Hindy, Moataza A.

Author_Institution

Nat. Res. Centre, Cairo, Egypt

Volume

37

Issue

5

fYear

1989

fDate

5/1/1989 12:00:00 AM

Firstpage

922

Lastpage

925

Abstract

An iterative method for obtaining the distribution of the relative permittivity ε_r(z) or electrical conductivity σ(z) of microwave semiconducting materials is presented. The semiconducting material is fitted in a rectangular waveguide which is terminated by a variable short circuit. The reflection coefficients of the system are measured at a single frequency and at different positions of the moving short. The measured coefficients are used in the iterative process of solving the inverse problem by obtaining the functional gradient. The method takes into account continuous and discontinuous profiles

Keywords

electrical conductivity measurement; iterative methods; measurement theory; microwave measurement; permittivity measurement; semiconductors; conductivity profiles; continuous profiles; discontinuous profiles; electrical conductivity; functional gradient; iterative method; measurement theory; microwave materials; moving short position; permittivity; rectangular waveguide; reflection coefficients; semiconducting materials; single frequency; variable short circuit; Conducting materials; Conductivity; Iterative methods; Microwave theory and techniques; Optimization methods; Permittivity; Rectangular waveguides; Semiconductivity; Semiconductor materials; Semiconductor waveguides;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.17462

Filename

17462