مرکز منطقه ای اطلاع رساني علوم و فناوري - Special Issue of IEEE Transactions on Device and Materials Reliability: “Negative Bias Temperature Instabilities”

DocumentCode :

811233

Title :

Special Issue of IEEE Transactions on Device and Materials Reliability: “Negative Bias Temperature Instabilities”

Volume :

Issue :

fYear :

2007

fDate :

5/1/2007 12:00:00 AM

Firstpage :

465

Lastpage :

465

Abstract :

Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers.

fLanguage :

English

Journal_Title :

Electron Device Letters, IEEE

Publisher :

ieee

ISSN :

0741-3106

Type :

jour

DOI :

10.1109/LED.2007.897548

Filename :

4160041

Link To Document :