• DocumentCode
    811376
  • Title

    1000-V 9.1- \\hbox {m}\\Omega \\cdot \\hbox {cm}^{2} Normally Off 4H-SiC Lateral RESURF JFET for Power Integrated Circuit Applications

  • Author

    Zhang, Yongxi ; Sheng, Kuang ; Su, Ming ; Zhao, Jian H. ; Alexandrov, Petre ; Fursin, Leonid

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ
  • Volume
    28
  • Issue
    5
  • fYear
    2007
  • fDate
    5/1/2007 12:00:00 AM
  • Firstpage
    404
  • Lastpage
    407
  • Abstract
    A 4H-SiC normally off vertical channel lateral reduced-surface electric-field (RESURF) junction field-effect transistor (JFET) with a blocking voltage Vbr of 1028 V and a specific on-resistance R on-sp of 9.1 mOmegamiddotcm2 has been experimentally demonstrated. The device has a Vbr 2/Ron-sp figure-of-merit of 116 MW/cm2, which is the highest value achieved to date on a 4H-SiC lateral power transistor. Also reported is a larger JFET that is capable of handling over 0.5-A current on an active area of 4.01times10-3 cm2. The fabricated double-RESURF devices have a vertical channel length of 1.8 mum, created by tilted aluminum (Al) implantation on the sidewalls of deep trenches, and a lateral drift-region length of 7.5 mum. In addition, low-voltage logic-inverter circuits based on the same lateral JFET process have been monolithically integrated on the same chip. Proper logic-inverter function has also been demonstrated
  • Keywords
    junction gate field effect transistors; logic gates; low-power electronics; power integrated circuits; silicon compounds; wide band gap semiconductors; 1000 V; 1028 V; SiC; junction field-effect transistor; lateral RESURF JFET; lateral power transistor; low-voltage logic-inverter circuits; power integrated circuit; reduced-surface electric-field; tilted aluminum implantation; FETs; JFET integrated circuits; MOSFETs; Photonic band gap; Power integrated circuits; Power transistors; Robustness; Silicon carbide; Temperature; Thermal management; Junction field-effect transistor (JFET); normally off; power integrated circuits; reduced-surface electric-field (RESURF) effect; silicon carbide (SiC);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2007.895448
  • Filename
    4160055