• DocumentCode
    811701
  • Title

    Arbitrary Decay Rate for Euler-Bernoulli Beam by Backstepping Boundary Feedback

  • Author

    Smyshlyaev, Andrey ; Guo, Bao-Zhu ; Krstic, Miroslav

  • Author_Institution
    Dept. of Mech. & Aerosp. Eng., Univ. of California at San Diego, La Jolla, CA
  • Volume
    54
  • Issue
    5
  • fYear
    2009
  • fDate
    5/1/2009 12:00:00 AM
  • Firstpage
    1134
  • Lastpage
    1140
  • Abstract
    We consider a problem of stabilization of the Euler-Bernoulli beam. The beam is controlled at one end (using position and moment actuators) and has the ldquoslidingrdquo boundary condition at the opposite end. We design the controllers that achieve any prescribed decay rate of the closed loop system, removing a long-standing limitation of classical ldquoboundary damperrdquo controllers. The idea of the control design is to use the well-known representation of the Euler-Bernoulli beam model through the Schrodinger equation, and then adapt recently developed backstepping designs for the latter in order to stabilize the beam. We derive the explicit integral transformation (and its inverse) of the closed-loop system into an exponentially stable target system. The transformation is of a novel Volterra/Fredholm type. The design is illustrated with simulations.
  • Keywords
    beams (structures); closed loop systems; control system synthesis; feedback; stability; transforms; Euler-Bernoulli beam; Schrodinger equation; Volterra/Fredholm type; arbitrary decay rate; backstepping boundary feedback; closed loop system; integral transformation; long-standing limitation; sliding boundary condition; stabilization; Actuators; Backstepping; Boundary conditions; Control design; Control systems; Eigenvalues and eigenfunctions; Feedback; Integral equations; Open loop systems; Schrodinger equation; Backstepping; Euler–Bernoulli beam; Riesz basis; boundary control; distributed parameter systems;
  • fLanguage
    English
  • Journal_Title
    Automatic Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9286
  • Type

    jour

  • DOI
    10.1109/TAC.2009.2013038
  • Filename
    4908973