Title :
A D&T special report-boundary scan: and end-of-term report-IEEE Std 1149.1 survey results
fDate :
6/1/1992 12:00:00 AM
Abstract :
The level of commercial support for and the extent to which manufacturers are using IEEE Std 1149.1 Standard Test-Access Port and Boundary-Scan Architecture in their products are described. The author´s involvement in the IEEE 1149.1 Working Group is discussed
Keywords :
automatic testing; integrated circuit testing; standards; Boundary-Scan Architecture; D&T special report; IEEE Std 1149.1 survey; Standard Test-Access Port; Working Group; boundary scan;
Journal_Title :
Design & Test of Computers, IEEE
