• DocumentCode
    811775
  • Title

    Application of Wigner-Ville distribution in electromigration noise analysis

  • Author

    Tan, Cher Ming ; Lim, Shin Yeh

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
  • Volume
    2
  • Issue
    2
  • fYear
    2002
  • fDate
    6/1/2002 12:00:00 AM
  • Firstpage
    30
  • Lastpage
    35
  • Abstract
    Electromigration noise analysis has shown great potential for the nondestructive evaluation of electromigration performance of metal stripe. However, contradictive conclusions have been published from the electromigration noise analysis. These contradictive conclusions mainly stem from the complex dynamics of the atomic movement during electromigration, rendering the electromigration noise as a nonstationary signal, and, hence, the standard Fourier transform is not adequate. Among the various nonstationary signal analysis tools, Wigner-Ville distribution is used for the analysis of electromigration noise data for the first time. It is found that much "hidden" and useful information in the noise data can be revealed by using this distribution. These information will enable us to "see" the dynamic of the atomic movement during electromigration, enhancing our understanding of electromigration processes.
  • Keywords
    Wigner distribution; electromigration; nondestructive testing; semiconductor device metallisation; semiconductor device noise; semiconductor device reliability; semiconductor device testing; Wigner-Ville distribution; electromigration noise analysis; metal stripe; metallization; nondestructive evaluation; nonstationary signal; Electromigration; Low-frequency noise; Noise measurement; Optical noise; Optical scattering; Performance analysis; Signal analysis; Stress; Temperature sensors; Testing;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2002.802114
  • Filename
    1030873