DocumentCode :
811828
Title :
Nonuniform phase distribution in ultrasound speckle analysis. I. Background and experimental demonstration
Author :
Weng, Li ; Reid, John M. ; Shankar, P.M. ; Soetanto, Kawan ; Lu, Xuan-Ming
Author_Institution :
Dept. of Electr. & Comput. Eng., Drexel Univ., Philadelphia, PA, USA
Volume :
39
Issue :
3
fYear :
1992
fDate :
5/1/1992 12:00:00 AM
Firstpage :
352
Lastpage :
359
Abstract :
In some cases, the statistical properties of the phase of ultrasound speckle in B-scan images differ from the uniform distribution characteristic exhibited by the fully developed speckle. This phenomenon has been noted when examining scattering structures with a somewhat regular spacing using wideband pulse excitation. It is shown by computer simulation and experiments on phantoms that when the mean scatterer spacing is equal to multiples of a half wavelength at the reference frequency of the receiver quadrature demodulator, the center of the echo phase distribution, plotted on the complex plane, will shift away from the origin. When the spacing is equal to an odd multiple of a quarter wavelength, the phase distribution will have a figure ´8´ shape. By noticing those noncircular phase distributions while changing the demodulation frequency, the mean scatterer spacing can be estimated.<>
Keywords :
acoustic imaging; biomedical ultrasonics; digital simulation; medical diagnostic computing; speckle; B-scan images; computer simulation; demodulation frequency; echo phase distribution; mean scatterer spacing; medical ultrasound; noncircular phase distributions; phantoms; random walk model; receiver quadrature demodulator; reference frequency; scattering structures; statistical properties; ultrasound speckle analysis; wideband pulse excitation; Computer simulation; Demodulation; Frequency estimation; Imaging phantoms; Phase estimation; Scattering; Shape; Speckle; Ultrasonic imaging; Wideband;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/58.143169
Filename :
143169
Link To Document :
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