• DocumentCode
    811941
  • Title

    Current capabilities/needs and future possibilities of multichip modules (MCM´s)

  • Author

    Johnson, R.R.

  • Author_Institution
    Utah Univ., Salt Lake City, UT
  • Volume
    38
  • Issue
    12
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    2689
  • Abstract
    Summary form only given. The state of the art was discussed in terms of costs, densities, speeds, sizes, yields, rework, testing methodologies, and thermal capabilities for the principle production interconnects. Comparisons were made for each of the newer MCM (multichip module) technologies for which data are available. Observations about costs, reworkability, assembly methods, yields, and testing were made to indicate the author´s views on where and how costs for MCMs can be driven down to become competitive with existing interconnect systems
  • Keywords
    integrated circuit technology; modules; packaging; technological forecasting; MCM; assembly methods; costs; densities; multichip modules; production interconnects; rework; sizes; speeds; testing methodologies; thermal capabilities; yields; Active matrix technology; Costs; Delay; Dielectric substrates; Liquid crystal displays; Multichip modules; Silicon compounds; Thermal management; Thin film transistors; Wiring;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.158696
  • Filename
    158696