DocumentCode :
811999
Title :
Optimized Device Characteristics of Lateral Spin Valves
Author :
Johnson, Mark
Author_Institution :
Naval Res. Lab., Washington DC, WA
Volume :
54
Issue :
5
fYear :
2007
fDate :
5/1/2007 12:00:00 AM
Firstpage :
1024
Lastpage :
1031
Abstract :
The lateral spin valve is a planar ferromagnet/nonmagnet/ferromagnet (F1/N/F2) structure with a resistance modulation DeltaR that derives from a nonequilibrium population of spin-polarized conduction electrons. This paper analyzes the characteristics of a future-generation all-metal device fabricated with minimum feature size f of 50 nm. Theoretical principles of operation are reviewed, and the "inverse scaling" rule is derived: Output resistance modulation varies inversely with the volume of the nonmagnetic material in the device. The thermodynamic formalism of Johnson and Silsbee is also used to study details of charge and spin transport at the F/N interface and to understand the limits of the fractional polarization of injected current. Experiments on lateral spin valves with N channels having widths of 150 nm are described. A high fractional polarization is observed for structures with low interface resistance. A survey of recent results on similar devices shows that inverse scaling is upheld over ten decades of sample volume. Using these experimentally observed parameters and extrapolating further to f = 50 nm, a spin-accumulation device that is fabricated to have an output impedance of 50 Omega and an output modulation of 50 Omega (DeltaR/R = 100%) is discussed
Keywords :
ferromagnetic materials; random-access storage; spin polarised transport; spin valves; 150 nm; 50 nm; Johnson-Silsbee thermodynamic formalism; MRAM; all-metal device; charge transport; ferromagnet/nonmagnet/ferromagnet structure; fractional polarization; inverse scaling rule; lateral spin valves; low interface resistance; magnetic random-access memory; reconfigurable logic; spin accumulation; spin injection; spin transport; spin-polarized conduction electrons; Anisotropic magnetoresistance; Impedance; Magnetic heads; Magnetic semiconductors; Magnetic tunneling; Magnetoelectronics; Nonvolatile memory; Polarization; Reconfigurable logic; Spin valves; Lateral spin valve; magnetic random-access memory (MRAM); reconfigurable logic; spin accumulation; spin injection;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2007.894374
Filename :
4160115
Link To Document :
بازگشت