DocumentCode :
812095
Title :
110-GHz GaInAs/InP double heterostructure p-i-n photodetectors
Author :
Wey, Yih-Guei ; Giboney, Kirk ; Bowers, John ; Rodwell, Mark ; Silvestre, Pierre ; Thiagarajan, Prabhu ; Robinson, Gary
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Volume :
13
Issue :
7
fYear :
1995
fDate :
7/1/1995 12:00:00 AM
Firstpage :
1490
Lastpage :
1499
Abstract :
Long-wavelength GaInAs/InP graded double heterostructure p-i-n photodiodes are demonstrated with 3-dB bandwidths over 100 GHz. The heterojunction hole trapping problem is significantly improved and the device contact resistivity is greatly reduced by using superlattice graded bandgap layers at the hetero-interfaces to reduce the barrier height. Self-aligned processes are used in the device fabrication to reduce device parasitics. Pulsewidths as short as 3.0 ps full-width-at-its-half-maximum (FWHM) for 2 μm×2 μm device are measured by pump-probe electrooptic sampling. 3-dB bandwidths over 100 GHz are found for 2 μm×2 μm and 3 μm×3 μm devices. The device with the integrated bias tee can be biased without using the external bias tee. The electrical resonance between the photodiode and external circuits was reduced by integrating an impedance matched resistor in parallel with the photodiode. The 7 μm×7 μm device with bias tee and matched resistor has a measured pulsewidth of 3.8 ps and a 3-dB bandwidth over 100 GHz. The calculated pulse shape based on the saturation velocity model fits well with the measured response. A model for different components of the series resistance agrees with the measured area dependence of the series resistance
Keywords :
III-V semiconductors; electrical conductivity; electro-optical effects; gallium arsenide; hole traps; indium compounds; optical pumping; p-i-n photodiodes; p-n heterojunctions; photodetectors; 110 GHz; 2 mum; 3 ps; 3.8 ps; 7 mum; GaInAs-InP; GaInAs/InP double heterostructure p-i-n photodetectors; GaInAs/InP graded double heterostructure p-i-n photodiodes; barrier height; calculated pulse shape; device contact resistivity; device fabrication; device parasitics; electrical resonance; external bias tee; full-width-at-its-half-maximum; hetero-interfaces; heterojunction hole trapping problem; impedance matched resistor; integrated bias tee; long-wavelength p-i-n photodiodes; measured area dependence; measured pulsewidth; measured response; pump-probe electrooptic sampling; saturation velocity model; self-aligned processes; superlattice graded bandgap layers; Bandwidth; Electrical resistance measurement; Heterojunctions; Indium phosphide; Integrated circuit measurements; PIN photodiodes; Photodetectors; Pulse measurements; Resistors; Shape measurement;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/50.400717
Filename :
400717
Link To Document :
بازگشت