DocumentCode :
812112
Title :
Gate-self-aligned n-channel and p-channel germanium MOSFETs
Author :
Jackson, Thomas N.
Volume :
38
Issue :
12
fYear :
1991
fDate :
12/1/1991 12:00:00 AM
Firstpage :
2695
Abstract :
Summary form only given. Gate-self-aligned germanium MOSFETs were fabricated. By gate-self-aligned it is meant that the gate is used as the mask structure for the ion implantation that forms heavily doped source and drain regions (previous self-aligned Ge MOSFETs used a dummy-gate process). A germanium oxynitride gate-dielectric was used to fabricate n- and p-channel germanium inversion-mode MOSFETs with transconductances >100 mS/mm at room temperature at a gate length of 0.6 μm for both n- and p-channel devices
Keywords :
dielectric thin films; elemental semiconductors; germanium; germanium compounds; insulated gate field effect transistors; ion implantation; 0.6 micron; Ge; GeOxNy dielectric; gate length; inversion-mode MOSFETs; room temperature; submicron transistors; transconductances; Aluminum; Bipolar transistors; Dielectric materials; Dielectric substrates; Germanium; Ion implantation; MOSFETs; Temperature; Transconductance; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.158709
Filename :
158709
Link To Document :
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