• DocumentCode
    812123
  • Title

    A new device structure and process flow for a low-leakage p-i-n diode-based integrated detector array

  • Author

    Snoeys, W. ; Plummer, James ; Parker, Stefan ; Kenney, C.

  • Author_Institution
    Center for Integrated Syst., Stanford Univ., CA
  • Volume
    38
  • Issue
    12
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    2696
  • Lastpage
    2697
  • Abstract
    Summary form only given. A device structure that makes it possible to integrate a one- or two-dimensional array of p-i-n diodes (providing one- or two-dimensional spatial resolution, respectively) with readout circuitry on the same high-resistivity substrate is presented. The spatial resolution is maximized by building the circuitry on top of the detecting elements, while avoiding loss of signal charge into the circuitry. A special gettering step to obtain low leakage in the p-i-n diodes is presented as well. The specific application for which this method was developed is a particle detector for high-energy physics, but many other applications are also possible
  • Keywords
    getters; p-i-n diodes; semiconductor counters; 2D pin diode arrays; device structure; gettering; high-energy physics; high-resistivity substrate; low-leakage p-i-n diode-based integrated detector array; particle detector; process flow; readout circuitry; spatial resolution; Energy barrier; Germanium silicon alloys; Heterojunctions; Hip; Infrared detectors; P-i-n diodes; PIN photodiodes; Photoelectricity; Silicon germanium; Substrates;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.158710
  • Filename
    158710