Title : 
Transistor critical sizing in MOBILE follower
         
        
            Author : 
Quintana, J.M. ; Avedillo, M.J.
         
        
            Author_Institution : 
IMSE-CNM, Univ. de Sevilla, Spain
         
        
        
        
        
            fDate : 
5/12/2005 12:00:00 AM
         
        
        
        
            Abstract : 
Analyses are presented of how the presence of the HFET transistor modifies the DC operation of a resonant tunnelling logic follower MOBILE. The difficulty of an analytical study for the resulting circuit has been overcome by resorting to simplified descriptions for both the RTD and the HFET I-V characteristics. We have obtained an analytical expression for the relation of the ratio of gate width to the gate length of the HFET below which a theoretically well designed follower does not operate correctly.
         
        
            Keywords : 
field effect transistors; logic design; logic gates; resonant tunnelling diodes; DC operation; HFET transistor; I-V characteristics; MOBILE follower; gate length; gate width; resonant tunelling diode; resonant tunnelling logic follower; transistor critical sizing;
         
        
        
            Journal_Title : 
Electronics Letters
         
        
        
        
        
            DOI : 
10.1049/el:20050388