DocumentCode :
812208
Title :
Influence of the Source–Gate Distance on the AlGaN/GaN HEMT Performance
Author :
Russo, Stefano ; Carlo, Aldo Di
Author_Institution :
Dept. of Electron. Eng., Univ. of Rome "Tor Vergata"
Volume :
54
Issue :
5
fYear :
2007
fDate :
5/1/2007 12:00:00 AM
Firstpage :
1071
Lastpage :
1075
Abstract :
In this paper, we present Monte Carlo simulation results on the source-gate (S-G) scaling effects in GaN-based HEMTs. The results show that a downscaling of the S-G distance can improve device performance, enhancing the output current and the device transconductance. The main reason for this effect is related to the peculiar dynamic of electrons in the GaN-based HEMTs, which leads to a nonsaturated velocity regime in the source access region, even for high drain applied voltages. On the contrary, the gate-drain distance does not affect the output current within the analyzed device geometries. Based on these results, new optimization strategies for GaN HEMTs could be defined
Keywords :
III-V semiconductors; Monte Carlo methods; aluminium compounds; gallium compounds; high electron mobility transistors; semiconductor device models; wide band gap semiconductors; AlGaN-GaN; HEMT performance; Monte Carlo simulation; device transconductance; gate-drain distance; high electron mobility transistors; nonsaturated velocity regime; source access region; source-gate distance; Aluminum gallium nitride; Dynamic voltage scaling; Electrons; Gallium nitride; Geometry; HEMTs; III-V semiconductor materials; Monte Carlo methods; Piezoelectric polarization; Transconductance; Device scaling; Gallium nitride; HEMT; Monte Carlo simulations; output current; transconductance;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2007.894614
Filename :
4160137
Link To Document :
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