• DocumentCode
    812208
  • Title

    Influence of the Source–Gate Distance on the AlGaN/GaN HEMT Performance

  • Author

    Russo, Stefano ; Carlo, Aldo Di

  • Author_Institution
    Dept. of Electron. Eng., Univ. of Rome "Tor Vergata"
  • Volume
    54
  • Issue
    5
  • fYear
    2007
  • fDate
    5/1/2007 12:00:00 AM
  • Firstpage
    1071
  • Lastpage
    1075
  • Abstract
    In this paper, we present Monte Carlo simulation results on the source-gate (S-G) scaling effects in GaN-based HEMTs. The results show that a downscaling of the S-G distance can improve device performance, enhancing the output current and the device transconductance. The main reason for this effect is related to the peculiar dynamic of electrons in the GaN-based HEMTs, which leads to a nonsaturated velocity regime in the source access region, even for high drain applied voltages. On the contrary, the gate-drain distance does not affect the output current within the analyzed device geometries. Based on these results, new optimization strategies for GaN HEMTs could be defined
  • Keywords
    III-V semiconductors; Monte Carlo methods; aluminium compounds; gallium compounds; high electron mobility transistors; semiconductor device models; wide band gap semiconductors; AlGaN-GaN; HEMT performance; Monte Carlo simulation; device transconductance; gate-drain distance; high electron mobility transistors; nonsaturated velocity regime; source access region; source-gate distance; Aluminum gallium nitride; Dynamic voltage scaling; Electrons; Gallium nitride; Geometry; HEMTs; III-V semiconductor materials; Monte Carlo methods; Piezoelectric polarization; Transconductance; Device scaling; Gallium nitride; HEMT; Monte Carlo simulations; output current; transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.894614
  • Filename
    4160137