DocumentCode
812208
Title
Influence of the Source–Gate Distance on the AlGaN/GaN HEMT Performance
Author
Russo, Stefano ; Carlo, Aldo Di
Author_Institution
Dept. of Electron. Eng., Univ. of Rome "Tor Vergata"
Volume
54
Issue
5
fYear
2007
fDate
5/1/2007 12:00:00 AM
Firstpage
1071
Lastpage
1075
Abstract
In this paper, we present Monte Carlo simulation results on the source-gate (S-G) scaling effects in GaN-based HEMTs. The results show that a downscaling of the S-G distance can improve device performance, enhancing the output current and the device transconductance. The main reason for this effect is related to the peculiar dynamic of electrons in the GaN-based HEMTs, which leads to a nonsaturated velocity regime in the source access region, even for high drain applied voltages. On the contrary, the gate-drain distance does not affect the output current within the analyzed device geometries. Based on these results, new optimization strategies for GaN HEMTs could be defined
Keywords
III-V semiconductors; Monte Carlo methods; aluminium compounds; gallium compounds; high electron mobility transistors; semiconductor device models; wide band gap semiconductors; AlGaN-GaN; HEMT performance; Monte Carlo simulation; device transconductance; gate-drain distance; high electron mobility transistors; nonsaturated velocity regime; source access region; source-gate distance; Aluminum gallium nitride; Dynamic voltage scaling; Electrons; Gallium nitride; Geometry; HEMTs; III-V semiconductor materials; Monte Carlo methods; Piezoelectric polarization; Transconductance; Device scaling; Gallium nitride; HEMT; Monte Carlo simulations; output current; transconductance;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2007.894614
Filename
4160137
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