DocumentCode :
812475
Title :
Improving Error Tolerance for Multithreaded Register Files
Author :
Wang, Lei ; Patel, Niral
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Connecticut, Storrs, CT
Volume :
16
Issue :
8
fYear :
2008
Firstpage :
1009
Lastpage :
1020
Abstract :
Chip multithreaded computing is exposed to the dual challenges of increasing system complexity and error sensitivity. It is critical to develop effective solutions that achieve better error tolerance without inducing performance degradation. In this paper, we propose a new error-tolerant memory design based on a unique computing phenomenon referred to as the dynamic multithreading redundancy (DMR). The proposed technique exploits the interplay between the concurrent threads for runtime error control. We also present two DMR enhancements, immediate write-back and self-recovery, to address the error accumulation effect. A multithreaded register file was implemented to demonstrate the proposed DMR technique. Simulation results on the SPEC CPU2000 benchmarks demonstrate significant overhead reduction in performance and energy efficiency related to error recovery. In addition, the proposed technique features good scalability with respect to the instruction-level and thread-level parallelism for next-generation processor design, where the soft error problem is expected to get worse due to technology scaling and architecture-affecting trends.
Keywords :
fault tolerant computing; integrated circuit design; integrated memory circuits; multi-threading; system recovery; SPEC CPU2000 benchmarks; chip multithreaded computing; concurrent threads; dynamic multithreading redundancy; error recovery; error sensitivity; error-tolerant memory design; instruction-level parallelism; multithreaded register files; next-generation processor design; overhead reduction; runtime error control; system complexity; thread-level parallelism; Degradation; Energy efficiency; Error correction; Multithreading; Parallel processing; Redundancy; Registers; Runtime; Scalability; Error tolerance; VLSI design; memory circuits; register files; soft errors;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2008.2000521
Filename :
4570470
Link To Document :
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