Title :
The Quantum Metal Ferroelectric Field-Effect Transistor
Author :
Frank, David J. ; Solomon, Paul M. ; Dubourdieu, C. ; Frank, Martin M. ; Narayanan, Vijaykrishnan ; Theis, Thomas N.
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
It has recently been suggested that ferroelectric (FE) negative capacitance effects can be used to achieve steep subthreshold slope field-effect transistors, which are greatly desired for reducing energy consumption in modern digital electronics. Here, we propose that this concept can be improved by the introduction of a very thin metal or metal-like layer (a quantum metal) between the FE and the semiconductor channel. We show how to design this layer so that it attenuates the polarization charge of the FE, applying an appropriate charge to the semiconductor, while at the same time presenting a relatively constant capacitance to the FE layer, as is needed to stabilize the negative capacitance regime. For homogeneous polarization, we estimate that this device (a QMFeFET) can have extremely steep subthreshold characteristics (2 mV/decade over 11 decades) and that its energy and delay performance are advantageous.
Keywords :
ferroelectric devices; field effect transistors; QMFeFET; digital electronics; energy consumption; ferroelectric negative capacitance effect; homogeneous polarization charge attenuation; metal-like layer; negative capacitance regime; quantum metal; quantum metal ferroelectric field-effect transistor; semiconductor channel; steep subthreshold slope field-effect transistor; very thin metal layer; Field effect transistors; Iron; Logic gates; Materials; Quantum capacitance; Ferroelectrics (FEs); field-effect transistor (FET); low power devices; negative capacitance; steep slope; steep slope.;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2014.2314652