Title :
Investigation of AlGaAs/GaAs superlattice-emitter resonant tunneling bipolar transistor (SE-RTBT)
Author :
Liu, Wen-Chua ; Lour, Wen-Shiung ; Wang, Yeong-Her
Author_Institution :
Dept. of Electr. Eng., Nat. Chang-Kung Univ., Tainan, Taiwan
fDate :
10/1/1992 12:00:00 AM
Abstract :
A bipolar transistor with an i-Al0.5Ga0.5As/n+-GaAs superlattice emitter as both hole reflection barriers and electron tunneling barriers has been fabricated successfully. The AlGaAs/GaAs potential spike is eliminated by moving the heterointerface away from the emitter-base junction. Both the turn-on voltage of emitter-base and base-collector junctions are almost identical for the same current level. The room-temperature common-emitter current gain is over 60, and a collector-emitter offset voltage of 55 mV has been obtained with a base-to-emitter doping ratio of 10. Multiple differential negative resistance phenomena and different transistor operating regimes have been observed due to the tunneling effects in the AlGaAs/GaAs superlattice at 77 K. Calculated results are in agreement with experimental ones. Because of the existence of high peak-to-valley current ratios as well as current gain over 65, the SE-RTBT is suitable for multivalued logic circuit applications with relatively reduced complexity
Keywords :
III-V semiconductors; aluminium compounds; bipolar transistors; gallium arsenide; negative resistance; resonant tunnelling devices; semiconductor superlattices; tunnelling; 77 K; Al0.5Ga0.5As-GaAs; base-collector junctions; collector-emitter offset voltage; common-emitter current gain; electron tunneling barriers; emitter-base junction; hole reflection barriers; i-Al0.5Ga0.5As/n+-GaAs; multiple differential negative resistance; multivalued logic circuit applications; resonant tunneling bipolar transistor; superlattice-emitter; tunneling effects; Bipolar transistors; Charge carrier processes; Doping; Electron emission; Gallium arsenide; Reflection; Resonance; Superlattices; Tunneling; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on