Title :
Analysis of the emitter-down configuration of double-heterojunction bipolar transistor
Author :
Zhang, Q.M. ; Lee, K. ; Tan, Gen Lin ; Xu, J.M.
Author_Institution :
Dept. of Electr. Eng., Toronto Univ., Ont., Canada
fDate :
10/1/1992 12:00:00 AM
Abstract :
A two-dimensional numerical study of the parasitic effects on current gain β and cutoff frequency fT of the emitter-down configuration of AlGaAs-GaAs double-heterojunction bipolar transistors (DHBTs) is reported. The studied structures include: those with and without the extrinsic emitter regions; a structure with oxygen implantation in the extrinsic emitter region; and two structures with P + dopant implantation of 1000 and 300 Å into the extrinsic emitter region. Analysis of the structures with and without the extrinsic emitter region shows that parasitic effects associated with the extrinsic emitter seriously degrade β and fT , and lead to extremely asymmetric DHBT operation. The three structures with the extrinsic emitter region modified by the implantations exhibit improved β and fT at low bias. However, the effectivenesses of the implant approaches in minimizing the parasitics are quite different
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; ion implantation; semiconductor device models; AlGaAs-GaAs; GaAs:O; GaAs:P; O implantation; P+ dopant implantation; asymmetric DHBT operation; current gain; cutoff frequency; double-heterojunction bipolar transistor; emitter-down configuration; extrinsic emitter regions; parasitic effects; two-dimensional numerical study; Analytical models; Bipolar integrated circuits; Bipolar transistors; Cutoff frequency; DH-HEMTs; Degradation; Gallium arsenide; Implants; Low voltage; Semiconductor devices;
Journal_Title :
Electron Devices, IEEE Transactions on