DocumentCode
812790
Title
Single-event-effect mitigation from a system perspective
Author
LaBel, Kenneth A. ; Gates, Michele M.
Author_Institution
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Volume
43
Issue
2
fYear
1996
fDate
4/1/1996 12:00:00 AM
Firstpage
654
Lastpage
660
Abstract
With the sharp decline in the availability of radiation-hardened devices from manufacturers, as well as the desire to shrink power, weight, and volume of spacecraft systems, the use of devices that are susceptible to single-event effects (SEEs) has become commonplace. We present herein a perspective and user´s tool for understanding SEE´s and potential system-level mitigation techniques
Keywords
aerospace control; aerospace simulation; aerospace testing; fault tolerant computing; radiation effects; radiation hardening (electronics); semiconductor device reliability; semiconductor device testing; simulation; space vehicle electronics; availability; control devices; ground test; hazards; memories; radiation-hardened devices; risks; simulation; single-event effects; system-level mitigation; Aerospace engineering; Aircraft manufacture; CMOS technology; Design engineering; Integrated circuit technology; Manufacturing; NASA; Solid state circuits; Space technology; Space vehicles;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.490908
Filename
490908
Link To Document