Title :
Single-event-effect mitigation from a system perspective
Author :
LaBel, Kenneth A. ; Gates, Michele M.
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
fDate :
4/1/1996 12:00:00 AM
Abstract :
With the sharp decline in the availability of radiation-hardened devices from manufacturers, as well as the desire to shrink power, weight, and volume of spacecraft systems, the use of devices that are susceptible to single-event effects (SEEs) has become commonplace. We present herein a perspective and user´s tool for understanding SEE´s and potential system-level mitigation techniques
Keywords :
aerospace control; aerospace simulation; aerospace testing; fault tolerant computing; radiation effects; radiation hardening (electronics); semiconductor device reliability; semiconductor device testing; simulation; space vehicle electronics; availability; control devices; ground test; hazards; memories; radiation-hardened devices; risks; simulation; single-event effects; system-level mitigation; Aerospace engineering; Aircraft manufacture; CMOS technology; Design engineering; Integrated circuit technology; Manufacturing; NASA; Solid state circuits; Space technology; Space vehicles;
Journal_Title :
Nuclear Science, IEEE Transactions on
