Recent trends in single-event effect ground testing

Author

Duzellier, S. ; Ecoffet, R.

Author_Institution

ONERA-CERT, Toulouse, France

Volume

43

Issue

2

fYear

1996

fDate

4/1/1996 12:00:00 AM

Firstpage

671

Lastpage

677

Abstract

Single-event phenomena result from a single particle, heavy ion or proton, inducing transients in the sensitive volume of integrated circuits. Particle accelerators are used to simulate the space environment in order to perform a full characterization of the components. This paper describes the methods and facilities necessary for single-event effect (SEE) testing as well as recent trends observed in the device response to radiation

Keywords

aerospace simulation; beam handling equipment; beam handling techniques; integrated circuit testing; ion beam effects; laboratory techniques; particle accelerators; proton effects; radiation hardening (electronics); simulation; space vehicle electronics; transients; cross section measurement; fibre optics; heavy ion; integrated circuits; laboratory facilities; optoelectronics; particle accelerators; proton; response to radiation; simulation; single particle; single-event effect ground testing; space environment; transients; Acceleration; Circuit simulation; Circuit testing; Energy exchange; Energy measurement; Integrated circuit testing; Ionization; Linear particle accelerator; Protons; Single event upset;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.490910

Filename

490910