DocumentCode :
812887
Title :
Segmented Dynamic Element Matching for High-Resolution Digital-to-Analog Conversion
Author :
Chan, Kok Lim ; Rakuljic, Nevena ; Galton, Ian
Author_Institution :
Inst. of Microelectron., Singapore
Volume :
55
Issue :
11
fYear :
2008
Firstpage :
3383
Lastpage :
3392
Abstract :
Dynamic element matching (DEM) is widely used in multibit digital-analog converters (DACs) to prevent mismatches among nominally identical components from introducing nonlinear distortion. It has long been used as a performance-enabling technique in delta-sigma data converters which require low-resolution but high-linearity DACs. More recently, segmented DEM architectures have made high-resolution Nyquist-rate DEM DACs practical. However, the previously published segmented DEM DAC designs have been ad hoc. Systematic techniques for synthesizing segmented DEM DACs and analyses of their design tradeoffs have not been published previously. This paper quantifies a fundamental power dissipation versus complexity tradeoff implied by segmentation and provides a systematic method of synthesizing segmented DEM DACs that are optimal in terms of the tradeoff.
Keywords :
computational complexity; digital-analogue conversion; high-resolution Nyquist-rate; high-resolution digital-to-analog conversion; multibit digital-analog converter; nonlinear distortion; performance-enabling technique; power dissipation; segmented dynamic element matching; systematic technique; Digital-to-analog conversion; dynamic element matching (DEM); segmentation;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2008.2001757
Filename :
4571116
Link To Document :
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