DocumentCode :
813128
Title :
Radiation Induced Currents in Subminiature Coaxial Cables
Author :
Bernstein, Melvin J.
Author_Institution :
Materials Sciences Laboratory the Aerospace Corporation, El Segundo, California 90245
Volume :
20
Issue :
6
fYear :
1973
Firstpage :
58
Lastpage :
63
Abstract :
Subminiature coaxial cables smaller than RG-58 were exposed to intense pulsed irradiation from a plasma focus device, and the currents induced on the center conductors were measured in a vacuum environment. The incident photons had energies mostly below 70 keV, and filters were used to vary the average hardness of the irradiation. The measured cable responses in units of Coulomb/rad(Si)-cm were compared to values calculated on the basis of photoemission from metal surfaces and electron ranges in insulators. It was found that the currents induced on the center conductors were several times larger than predicted for an ideal coaxial geometry because of small gaps between the dielectric surface and overlapping braid wires. For a given cable type, such as RG-174/U, large variations in cable responses were found according to each manufacturer´s construction techniques.
Keywords :
Coaxial cables; Conductors; Current measurement; Electrons; Filters; Metal-insulator structures; Photoelectricity; Plasma devices; Plasma measurements; Pulse measurements;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1973.4327373
Filename :
4327373
Link To Document :
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