DocumentCode :
813654
Title :
Carbon nanotube electronics
Author :
Avouris, Phaedon ; Appenzeller, Joerg ; Martel, Richard ; Wind, Shalom J.
Author_Institution :
T. J. Watson Res. Center, IBM Res. Div., Yorktown Heights, NY, USA
Volume :
91
Issue :
11
fYear :
2003
fDate :
11/1/2003 12:00:00 AM
Firstpage :
1772
Lastpage :
1784
Abstract :
We evaluate the potential of carbon nanotubes (CNTs) as the basis for a new nanoelectronic technology. After briefly reviewing the electronic structure and transport properties of CNTs, we discuss the fabrication of CNT field-effect transistors (CNTFETs) formed from individual single-walled nanotubes (SWCNTs), SWCNT bundles, or multiwalled (MW) CNTs. The performance characteristics of the CNTFETs are discussed and compared to those of corresponding silicon devices. We show that CNTFETs are very competitive with state-of-the-art conventional devices. We also discuss the switching mechanism of CNTFETs and show that it involves the modulation by the gate field of Schottky barriers at the metal-CNT junctions. This switching mechanism can account for the observed subthreshold and vertical scaling behavior of CNTFETs, as well as their sensitivity to atmospheric oxygen. The potential for integration of CNT devices is demonstrated by fabricating a logic gate along a single nanotube molecule. Finally, we discuss our efforts to grow CNTs locally and selectively, and a method is presented for growing oriented SWCNTs without the involvement of a metal catalyst.
Keywords :
Schottky gate field effect transistors; carbon nanotubes; logic gates; nanoelectronics; nanotube devices; C; SWCNT bundle; Schottky barrier; carbon nanotube electronics; electronic structure; field effect transistor; logic gate; molecular electronics; multi-walled nanotube; nanoelectronic technology; single-walled nanotube; transport properties; Bonding; Carbon nanotubes; Chemicals; Dielectrics and electrical insulation; FETs; Fabrication; Semiconductivity; Silicon devices; Space technology; Thermal resistance;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/JPROC.2003.818338
Filename :
1240070
Link To Document :
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