DocumentCode :
813726
Title :
Room temperature measurement of the anisotropic loss tangent of sapphire using the whispering gallery mode technique
Author :
Hartnett, John G. ; Tobar, Michael E. ; Ivanov, Eugene N. ; Krupka, Jerzy
Author_Institution :
Sch. of Phys., Western Australia Univ., Crawley, WA, Australia
Volume :
53
Issue :
1
fYear :
2006
Firstpage :
34
Lastpage :
38
Abstract :
The anisotropic loss tangent has been determined in monocrystalline sapphire for components parallel and perpendicular to the crystal axis, using the whispering gallery (WG) mode method. The Q-factors of quasi-TE and quasi-TM modes were measured precisely in four cylindrical sapphire resonators at room temperature, from which was determined a maximum attainable Q-factor of (2.1 /spl plusmn/ 0.2) /spl times/ 10/sup 5/ at 9 GHz in a quasi-TM mode. Sapphire dielectric material from three different manufacturers was compared over the 270-345 K temperature range and the 5-16 GHz frequency range.
Keywords :
anisotropic media; dielectric materials; dielectric resonators; sapphire; temperature measurement; whispering gallery modes; 270 to 345 K; 5 to 16 GHz; 9 GHz; anisotropic loss tangent; dielectric material; monocrystalline sapphire; room temperature measurement; sapphire resonators; whispering gallery mode technique; Anisotropic magnetoresistance; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency; Oscillators; Phase noise; Q factor; Temperature measurement; Whispering gallery modes;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2006.1588389
Filename :
1588389
Link To Document :
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