Title :
Offline geometric parameters for automatic signature verification using fixed-point arithmetic
Author :
Ferrer, Miguel A. ; Alonso, Jesús B. ; Travieso, Carlos M.
Author_Institution :
Departamento de Senales y Comunicaciones, De Las Palmas de Gran Canaria Univ., Spain
fDate :
6/1/2005 12:00:00 AM
Abstract :
This paper presents a set of geometric signature features for offline automatic signature verification based on the description of the signature envelope and the interior stroke distribution in polar and Cartesian coordinates. The features have been calculated using 16 bits fixed-point arithmetic and tested with different classifiers, such as hidden Markov models, support vector machines, and Euclidean distance classifier. The experiments have shown promising results in the task of discriminating random and simple forgeries.
Keywords :
feature extraction; fixed point arithmetic; handwriting recognition; hidden Markov models; support vector machines; Cartesian coordinates; Euclidean distance classifier; automatic signature verification; fixed-point arithmetic; geometric signature feature; hidden Markov model; interior stroke distribution; offline geometric parameters; polar coordinates; signature envelope; support vector machine; Euclidean distance; Fixed-point arithmetic; Forgery; Handwriting recognition; Hidden Markov models; Shape; Support vector machine classification; Support vector machines; Testing; Writing; Automatic Signature Verification (ASV); Hidden Markov Models (HMM); Support Vector Machines (SVM); fixed-point arithmetic.; Algorithms; Artificial Intelligence; Automatic Data Processing; Computer Graphics; Handwriting; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Reading; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Subtraction Technique; User-Computer Interface;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2005.125