DocumentCode
813937
Title
Performance modeling using additive regression splines
Author
Chao, Chieh-Yuan ; Milor, Linda S.
Author_Institution
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
Volume
8
Issue
3
fYear
1995
fDate
8/1/1995 12:00:00 AM
Firstpage
239
Lastpage
251
Abstract
Circuit designers need to be able to predict variations in circuit performance as a function of variations in process parameters. Often the relation between process parameters and circuit performances is highly nonlinear, and the process is described by a large number of independent variables. Traditional approaches to modeling, like, polynomial regression, are not very accurate for such problems. In order to build accurate nonlinear models for high-dimensional problems, an algorithm has been implemented based on additive regression splines. The model building process is fully automated. The algorithm is used to build a model to predict the offset voltage of a parallel filter bank. This example demonstrates that very accurate nonlinear models can be constructed very efficiently
Keywords
VLSI; circuit optimisation; integrated circuit yield; semiconductor process modelling; splines (mathematics); statistical analysis; additive regression splines; circuit performance; circuit yield; high-dimensional problems; model building process; nonlinear models; parallel filter bank; performance modeling; process parameters; Analytical models; Buildings; Chaos; Circuit optimization; Circuit simulation; Equations; Manufacturing processes; Monte Carlo methods; Performance analysis; Polynomials;
fLanguage
English
Journal_Title
Semiconductor Manufacturing, IEEE Transactions on
Publisher
ieee
ISSN
0894-6507
Type
jour
DOI
10.1109/66.400998
Filename
400998
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