Title :
Probabilistic finite-state machines - part I
Author :
Vidal, Enrique ; Thollard, Franck ; de la Higuera, C. ; Casacuberta, Francisco ; Carrasco, Rafael C.
Author_Institution :
Departamento de Sistemas Informaticos y Computacion, Univ. Politecnica de Valencia, Spain
fDate :
7/1/2005 12:00:00 AM
Abstract :
Probabilistic finite-state machines are used today in a variety of areas in pattern recognition, or in fields to which pattern recognition is linked: computational linguistics, machine learning, time series analysis, circuit testing, computational biology, speech recognition, and machine translation are some of them. In Part I of this paper, we survey these generative objects and study their definitions and properties. In Part II, we study the relation of probabilistic finite-state automata with other well-known devices that generate strings as hidden Markov models and n-grams and provide theorems, algorithms, and properties that represent a current state of the art of these objects.
Keywords :
finite state machines; pattern recognition; probabilistic automata; circuit testing; computational biology; computational linguistics; hidden Markov models; machine learning; machine translation; pattern recognition; probabilistic finite-state automata; probabilistic finite-state machines; speech recognition; time series analysis; Circuit analysis; Circuit testing; Computational biology; Computational linguistics; Machine learning; Pattern analysis; Pattern recognition; Speech analysis; Speech recognition; Time series analysis; Index Terms- Automata; classes defined by grammars or automata; language acquisition; language models; language parsing and understanding; machine learning; machine translation; speech recognition and synthesis; structural pattern recognition; syntactic pattern recognition.; Algorithms; Artificial Intelligence; Cluster Analysis; Computer Simulation; Information Storage and Retrieval; Models, Statistical; Natural Language Processing; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Sequence Alignment; Sequence Analysis; Signal Processing, Computer-Assisted;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2005.147