DocumentCode :
814122
Title :
A probabilistic model of face mapping with local transformations and its application to person recognition
Author :
Perronnin, Florent ; Dugelay, Jean-Luc ; Rose, Kenneth
Author_Institution :
Image Process. Group, Xerox Res. Centre Eur., Meylan, France
Volume :
27
Issue :
7
fYear :
2005
fDate :
7/1/2005 12:00:00 AM
Firstpage :
1157
Lastpage :
1171
Abstract :
This paper proposes a new measure of "distance" between faces. This measure involves the estimation of the set of possible transformations between face images of the same person. The global transformation, which is assumed to be too complex for direct modeling, is approximated by a patchwork of local transformations, under a constraint imposing consistency between neighboring local transformations. The proposed system of local transformations and neighboring constraints is embedded within the probabilistic framework of a two-dimensional hidden Markov model. More specifically, we model two types of intraclass variabilities involving variations in facial expressions and illumination, respectively. The performance of the resulting method is assessed on a large data set consisting of four face databases. In particular, it is shown to outperform a leading approach to face recognition, namely, the Bayesian intra/extrapersonal classifier.
Keywords :
face recognition; hidden Markov models; probability; Bayesian extrapersonal classifier; Bayesian intrapersonal classifier; face databases; face images; face mapping; face recognition; facial expressions; global transformation; intraclass variabilities; local transformations; person recognition; probabilistic model; two-dimensional hidden Markov model; Bayesian methods; Biometrics; Face recognition; Hidden Markov models; Image databases; Image processing; Lighting; Pattern classification; Probability density function; Shape measurement; Index Terms- Biometrics; distance.; face recognition; hidden Markov model; image processing; Algorithms; Artificial Intelligence; Cluster Analysis; Computer Simulation; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Models, Statistical; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Signal Processing, Computer-Assisted;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2005.130
Filename :
1432747
Link To Document :
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