• DocumentCode
    814122
  • Title

    A probabilistic model of face mapping with local transformations and its application to person recognition

  • Author

    Perronnin, Florent ; Dugelay, Jean-Luc ; Rose, Kenneth

  • Author_Institution
    Image Process. Group, Xerox Res. Centre Eur., Meylan, France
  • Volume
    27
  • Issue
    7
  • fYear
    2005
  • fDate
    7/1/2005 12:00:00 AM
  • Firstpage
    1157
  • Lastpage
    1171
  • Abstract
    This paper proposes a new measure of "distance" between faces. This measure involves the estimation of the set of possible transformations between face images of the same person. The global transformation, which is assumed to be too complex for direct modeling, is approximated by a patchwork of local transformations, under a constraint imposing consistency between neighboring local transformations. The proposed system of local transformations and neighboring constraints is embedded within the probabilistic framework of a two-dimensional hidden Markov model. More specifically, we model two types of intraclass variabilities involving variations in facial expressions and illumination, respectively. The performance of the resulting method is assessed on a large data set consisting of four face databases. In particular, it is shown to outperform a leading approach to face recognition, namely, the Bayesian intra/extrapersonal classifier.
  • Keywords
    face recognition; hidden Markov models; probability; Bayesian extrapersonal classifier; Bayesian intrapersonal classifier; face databases; face images; face mapping; face recognition; facial expressions; global transformation; intraclass variabilities; local transformations; person recognition; probabilistic model; two-dimensional hidden Markov model; Bayesian methods; Biometrics; Face recognition; Hidden Markov models; Image databases; Image processing; Lighting; Pattern classification; Probability density function; Shape measurement; Index Terms- Biometrics; distance.; face recognition; hidden Markov model; image processing; Algorithms; Artificial Intelligence; Cluster Analysis; Computer Simulation; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Models, Statistical; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Signal Processing, Computer-Assisted;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2005.130
  • Filename
    1432747