• DocumentCode
    814322
  • Title

    Parallel computational techniques for simulating dopant diffusion in silicon

  • Author

    Biswas, R. ; Amaratunga, G.A.J.

  • Author_Institution
    Dept. of Eng., Cambridge Univ., UK
  • Volume
    136
  • Issue
    3
  • fYear
    1989
  • fDate
    6/1/1989 12:00:00 AM
  • Firstpage
    135
  • Lastpage
    137
  • Abstract
    Parallel computational techniques have been used to simulate dopant diffusion in Si (e.g. source/drain fabrication of a CMOS transistor) on an ICL distributed array processor (DAP), a single-instruction multiple-data-stream (SIMD) type machine. The finite element and conjugate gradient methods were used for solution. An order of magnitude reduction in computation time has been achieved.<>
  • Keywords
    diffusion in solids; digital simulation; electronic engineering computing; elemental semiconductors; finite element analysis; parallel algorithms; physics computing; semiconductor device models; semiconductor doping; silicon; ICL distributed array processor; SIMD type machine; Si; computation time reduction; conjugate gradient methods; digital simulation; dopant diffusion; elemental semiconductors; parallel computational techniques; single-instruction multiple-data-stream; Diffusion processes; Finite element methods; Parallel algorithms; Semiconductor device doping; Semiconductor device modeling; Silicon; Simulation;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices and Systems, IEE Proceedings G
  • Publisher
    iet
  • ISSN
    0956-3768
  • Type

    jour

  • Filename
    17641