• DocumentCode
    814521
  • Title

    Indirect testing of digital-correction circuits in analog-to-digital converters with redundancy

  • Author

    Lewis, Stephen H. ; Ramachandran, R. ; Snelgrove, W. Martin

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
  • Volume
    42
  • Issue
    7
  • fYear
    1995
  • fDate
    7/1/1995 12:00:00 AM
  • Firstpage
    437
  • Lastpage
    445
  • Abstract
    This paper presents a study of indirect fault testing of digital-correction circuits that operate as a part of analog-to-digital converters with redundancy. Design and test techniques that improve the fault coverage are described. The limitations of these techniques and methods to overcome these limitations are presented
  • Keywords
    analogue-digital conversion; fault diagnosis; integrated circuit testing; redundancy; ADC testing; analog-to-digital converters; digital-correction circuits; fault coverage improvement; indirect fault testing; redundancy; Analog-digital conversion; BiCMOS integrated circuits; CMOS technology; Circuit faults; Circuit testing; Costs; Logic testing; Power dissipation; Redundancy; Signal processing algorithms;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7130
  • Type

    jour

  • DOI
    10.1109/82.401166
  • Filename
    401166
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=814521