Title :
Guest editorial [Special section on innovations in VLSI automatic test equipment (ATEs)]
Author :
Das, Sunil R. ; Rajsuman, R.
Author_Institution :
School of Information Technology and Engineering, University of Ottawa
Keywords :
Automatic test equipment; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Design for testability; Integrated circuit testing; System testing; Technological innovation; Very large scale integration;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2003.819774
