• DocumentCode
    814545
  • Title

    Guest editorial [Special section on innovations in VLSI automatic test equipment (ATEs)]

  • Author

    Das, Sunil R. ; Rajsuman, R.

  • Author_Institution
    School of Information Technology and Engineering, University of Ottawa
  • Volume
    52
  • Issue
    5
  • fYear
    2003
  • Firstpage
    1350
  • Lastpage
    1352
  • Keywords
    Automatic test equipment; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Design for testability; Integrated circuit testing; System testing; Technological innovation; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2003.819774
  • Filename
    1240148
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=814545