• DocumentCode
    814562
  • Title

    Two-type-interlaced structure and LBR test for low-sensitivity digital filter realization

  • Author

    Lim, II-Taek ; Lee, Byeong Gi

  • Author_Institution
    LG Electronics Res. Center, Seoul, South Korea
  • Volume
    42
  • Issue
    7
  • fYear
    1995
  • fDate
    7/1/1995 12:00:00 AM
  • Firstpage
    473
  • Lastpage
    477
  • Abstract
    The authors present a new digital filter structure which shows a low-sensitivity property. It is a cascade structure consisting of Type 1 and Type 2 LBR two-pairs interlacing each other, and is called a two-type-interlaced (TTI) structure. In addition, a test procedure called an LBR test is introduced as a means to determine the LBR-ness of the quantized TTI structure by checking the LBR-ness of the residual Type 1 two-pair in the associated Type 3 re-assembled structure. Computer simulation confirms that this new structure exhibits a much improved sensitivity characteristic over the other existing structures
  • Keywords
    cascade networks; circuit stability; digital filters; filtering theory; sensitivity analysis; LBR test; cascade structure; digital filter structure; lossless bounded real test; low-sensitivity digital filter; low-sensitivity property; test procedure; two-type-interlaced structure; Analog circuits; Chebyshev approximation; Circuit noise; Circuit testing; Computer simulation; Degradation; Digital filters; Filtering; Lattices; Passband;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7130
  • Type

    jour

  • DOI
    10.1109/82.401171
  • Filename
    401171