• DocumentCode
    814697
  • Title

    Modeling of Eye-Diagram Distortion and Data-Dependent Jitter in Meander Delay Lines on High-Speed Printed Circuit Boards (PCBs) Based on a Time-Domain Even-Mode and Odd-Mode Analysis

  • Author

    Kim, Gawon ; Dong Gun Kam ; Seung Jae Lee ; Kim, Jaemin ; Ha, Myunghyun ; Koo, Kyoungchoul ; Jun So Pak ; Kim, Joungho

  • Author_Institution
    Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon
  • Volume
    56
  • Issue
    8
  • fYear
    2008
  • Firstpage
    1962
  • Lastpage
    1972
  • Abstract
    Crosstalk induced in a meander delay line produces a significant amount of waveform distortion and data-dependent jitter at the output port. This paper introduces an interpretation of the eye-diagram distortion and the jitter generation mechanism based on a time-domain even- and odd-mode analysis of a coupled transmission line structure. From the proposed analysis, this paper proposes jitter-estimation equations for both the short and long unit line delay cases. The eye-diagram distortion and timing jitter are predicted and estimated, respectively. In order to verify the jitter-estimation equations, a series of microstrip-type printed circuit board test vehicles with the meander delay line are fabricated and tested. The measured jitter shows good agreement with the proposed jitter-estimation equations.
  • Keywords
    crosstalk; jitter; printed circuit design; time-domain analysis; coupled transmission line structure; crosstalk; data-dependent jitter; eye-diagram distortion; jitter generation mechanism; jitter-estimation equations; meander delay lines; microstrip-type printed circuit board test vehicles; printed circuit board design; time-domain even-mode analysis; time-domain odd-mode analysis; waveform distortion; Crosstalk; data-dependent jitter (DDJ); eye diagram; meander delay line;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2008.927543
  • Filename
    4578715